JTAG - Boundary Scan
We offer EMS companies and design houses services and solutions in manufacturing testing with bias towards JTAG (IEEE 1149.x Boundary Scan) and functional test:
- System-level DFT rule checking for production testing and inspection
- Test strategy development and optimization for test cost reduction
- JTAG, functional, and emulation-based test development and deployment
- Product testing and troubleshooting services
- Ultra fast in-system programming solutions (Flash, EEPROM)
- Development and integration of customized JTAG-based test equipment
- Development of debug and test access software for MPUs and MCUs
- Development and debug of embedded software/firmware
- Development of VarioTAP models for microprocessors and microcontrollers
- Development of customized ChipVORX models and IPs
- Development of FPGA-based test instruments and solutions
The services can be offered both at Testonica Lab premises in Tallinn, Estonia as well as at the customer site anywhere in Europe and beyond. Consultancy and test development can be done distantly with deployment on site. We implement this operation mode successfully with several customers.